CITATION STYLE
Schmidt, T., Marchetto, H., Fink, R., & Umbach, E. (2009). High-resolution spectro-microscopy with low-voltage electrons and double aberration correction. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 7–8). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_4
Mendeley helps you to discover research relevant for your work.