Bunch time structure detector with picosecond resolution

Abstract

We propose a device measuring bunch time structure of continuous wave beams, based on radio frequency (RF) analysis of low energy secondary electrons, (SEs). By using a currently developed 500 MHz RF deflector it is possible to scan circularly and detect the SEs, amplified in multi-channel plates (MCP). It is demonstrated that the noise induced by RF source is negligible and the signals, generated in MCP, can be processed event by event, without integration, by using available nanosecond-time electronics. Therefore, this new device can be operated alone as well as in combination with more complex setups, using common electronics and providing time resolution for single SE better than 20 ps. © 2007 Springer.