Method for Precise Force Measurements

Abstract

Quantitative force analysis using noncontact atomic force microscopy (NC-AFM) requires strict experimental conditions. Tip–sample positioning is an especially critical issue and thermal drift is a significant disturbance effecting precise force measurements. This chapter concentrates on techniques of tip–sample positioning at the atomic level for force measurements. Methods for compensating the thermal drift enable measurements of force spectroscopy and force mapping even at room temperature, for which precise force measurement had previously been thought impossible. The methods are also useful at low temperatures