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Scanning Force Microscopy of Latent Heavy-Ion Tracks in Ultrahigh Vacuum

  • Ackermann J
  • Grafström S
  • Hagen T
  • et al.
Springer Netherlands, (1997), 261-267
DOI: 10.1007/978-94-011-5646-2_17
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Ackermann, J., Grafström, S., Hagen, T., Kowalski, J., Neumann, R., & Sedlacek, M. (1997). Scanning Force Microscopy of Latent Heavy-Ion Tracks in Ultrahigh Vacuum. In Micro/Nanotribology and Its Applications (pp. 261–267). Springer Netherlands. https://doi.org/10.1007/978-94-011-5646-2_17

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