Accelerated Degradation of SiO/NCM Cell Quick Rechargeability Due to Depth-of-Discharge Range Dependent Failure Induced Li Dendrite Formation

Abstract

The failure of the quick rechargeability of SiO-based lithium-ion batteries is examined based on different SOC ranges pre-cycling. In detail, the effect of the SiO electrode during normal C -rate applied cycling on the subsequent quick charge is analyzed. The degradation of the SiO electrode is greatly influenced by the design of cycling SOC range of the SiO/NCM811 cell, and severe mechanical and solid electrolyte interphase degradation of the SiO electrode occurred with highly utilized SiO electrodes, resulting in Li plating on the SiO surface under quick charge conditions due to the low open-circuit voltage of SiO electrode and high charge transfer resistance, which is derived from the Li-trap at SiO and subsequent SEI development and electrode crack. The degraded SiO electrode is vulnerable to Li plating at high C -rate applications; hence, the pre-cycling condition of the SiO electrode influences the quick rechargeability of the SiO/NCM811 cell. Consequently, proper manipulation of the cycling range of SiO-based cells should be conducted to enhance the durability of SiO-based quick rechargeable cells.