Free-standing metallic thin films are increasingly used as structural components in MEMS. In commercial devices, long-term reliability is essential, which requires determining time-dependent mechanical properties of these films. The uniaxial tensile test is a preferred method due to uncomplicated determination of the stress and strain state. However, at the MEMS-scale this method is not straightforward: specimen handling and loading, force and deformation measurement need careful consideration. Here we discuss the challenges of the application and measurement of nano-Newton forces, nanometer deformations and micro-radians rotation alignment ensuring negligible bending in on-chip tensile test structures during long periods. We then present a novel tensile-testing instrument with in-situ capabilities in SEM and Optical Profilometry. The design solutions to measure these small forces and deformations whilst ensuring a uniaxial stress state will be presented.
CITATION STYLE
Bergers, L. I. J. C., Hoefnagels, J. P. M., Dekkers, E. C. A., & Geers, M. G. D. (2011). A nano-tensile tester for creep studies. In Conference Proceedings of the Society for Experimental Mechanics Series (Vol. 4, pp. 25–29). Springer New York LLC. https://doi.org/10.1007/978-1-4614-0210-7_4
Mendeley helps you to discover research relevant for your work.