A Modified Artificial Bee Colony Based Test Suite Generation Strategy for Uniform T-Way Testing

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Abstract

Today, t-way testing has been widely known with the ability to reduce test suite size compared to exhaustive testing. At the same time, it has been proven by many researchers to provide maximum bug detection capability. Thus, various t-way strategies were developed since the past three decades. The paper proposed a new test generation strategy, named Modified Artificial Bee Colony T-Way Test Suite Generation (MABCTS). It supports uniform strength t-way testing. Experimentation results are compared with present strategies and produced comparable results. Since t-way testing is considered an NP-hard problem, there are no strategies that can be demanded to produce the best results.

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Rashid Ali, M. S. A., Othman, R. R., Yahya, Z. R., & Zahir, M. Z. (2020). A Modified Artificial Bee Colony Based Test Suite Generation Strategy for Uniform T-Way Testing. In IOP Conference Series: Materials Science and Engineering (Vol. 767). Institute of Physics Publishing. https://doi.org/10.1088/1757-899X/767/1/012020

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