We have used spatial atomic layer deposition (SALD) to fabricate metal oxide thin-film devices with unusually simple processes. Selective area deposition allows us to fabricate transistors and circuits additively and with digital design variations when used in combination with an inkjet-printed inhibitor. In a second approach, we use the conformal nature of SALD films to produce self-aligned sub-micron channel length vertical transistors that have large alignment tolerances and are suitable for high-performance thin-film electronics. We discuss device design considerations for both architectures.
CITATION STYLE
Nelson, S. F., Ellinger, C. R., & Tutt, L. W. (2014). Design Considerations for ZnO Transistors Made Using Spatial ALD. ECS Transactions, 64(9), 73–83. https://doi.org/10.1149/06409.0073ecst
Mendeley helps you to discover research relevant for your work.