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Book Chapter

In-Situ Electron Microscopy for Nanomeasurements

  • Wang Z
Kluwer Academic Publishers, (2006), 493-530
DOI: 10.1007/1-4020-8006-9_16
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Abstract

A review describes the temp.-driven in-situ process, which is one of the most established application of TEM. The theory and techniques that were developed for characterizing the properties of quasi-one-dimensional nanostructures are discussed. [on SciFinder(R)]

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Wang, Z. L. (2006). In-Situ Electron Microscopy for Nanomeasurements. In Handbook of Microscopy for Nanotechnology (pp. 493–530). Kluwer Academic Publishers. https://doi.org/10.1007/1-4020-8006-9_16

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