CITATION STYLE
Both, T. H., da Silva, M. B., Wirth, G. I., Tuinhout, H. P., Zegers-van Duijnhoven, A., Croon, J. A., & Scholten, A. J. (2020). An overview on statistical modeling of random telegraph noise in the frequency domain. In Noise in Nanoscale Semiconductor Devices (pp. 495–516). Springer International Publishing. https://doi.org/10.1007/978-3-030-37500-3_15
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