Concept of a spectrometer for resonant inelastic X-ray scattering with parallel detection in incoming and outgoing photon energies

Abstract

A spectrometer for resonant inelastic X-ray scattering (RIXS) is proposed where imaging and dispersion actions in two orthogonal planes are combined to deliver a full two-dimensional map of RIXS intensity in one shot with parallel detection at incoming hv in and outgoing hv out photon energies. Preliminary ray-tracing simulations with a typical undulator beamline demonstrate a resolving power well above 11000 with both hv in and hv out near 930 eV, with a vast potential for improvement. Combining this instrument - nicknamed hv 2 spectrometer - with an X-ray free-electron laser source simplifies its technical implementation and enables efficient time-resolved RIXS experiments. © 2010 International Union of Crystallography. Printed in Singapore - all rights reserved.