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Atom probe tomography of a commercial light emitting diode

Journal of Physics: Conference Series (2013) 471(1)
DOI: 10.1088/1742-6596/471/1/012030
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Abstract

The atomic-scale analysis of a commercial light emitting diode device purchased at retail is demonstrated using a local electrode atom probe. Some of the features are correlated with transmission electron microscopy imaging. Subtle details of the structure that are revealed have potential significance for the design and performance of this device.

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Larson, D. J., Prosa, T. J., Olson, D., Lefebvre, W., Lawrence, D., Clifton, P. H., & Kelly, T. F. (2013). Atom probe tomography of a commercial light emitting diode. In Journal of Physics: Conference Series (Vol. 471). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/471/1/012030

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