Stark widths of faint Si II lines

A. Lesage; R. Redon

Journal ArticleOPEN ACCESS

Stark widths of faint Si II lines

Lesage A
Redon R

Astronomy and Astrophysics (2004) 418(2) 765-769

DOI: 10.1051/0004-6361:20035585

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Abstract

Line profiles of faint Si II lines of astrophysical interest are observed in a conventional shock tube. Electron density is 1.3 × 1023 m-3, and the temperature is 11000 K. The Stark effect is the dominant broadening mechanism. The Si II line at λ 419.07 nm (multiplet 7.26, Moore 1965) Stark width is measured and compared with theoretical prediction.

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Lesage, A., & Redon, R. (2004). Stark widths of faint Si II lines. Astronomy and Astrophysics, 418(2), 765–769. https://doi.org/10.1051/0004-6361:20035585

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Stark widths of faint Si II lines

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