Realistic descriptions of surface reflectance have long been a topic of interest in both computer vision and computer graphics research. In this paper, we describe a novel high speed approach for the acquisition of bidirectional reflectance distribution functions (BRDFs). We develop a new theory for directly measuring BRDFs in a basis representation by projecting incident light as a sequence of basis functions from a spherical zone of directions. We derive an orthonormal basis over spherical zones that is ideally suited for this task. BRDF values outside the zonal directions are extrapolated by re-projecting the zonal measurements into a spherical harmonics basis, or by fitting analytical reflection models to the data. For specular materials, we experiment with alternative basis acquisition approaches such as compressive sensing with a random subset of the higher order orthonormal zonal basis functions, as well as measuring the response to basis defined by an analytical model as a way of optically fitting the BRDF to such a representation. We verify this approach with a compact optical setup that requires no moving parts and only a small number of image measurements. Using this approach, a BRDF can be measured in just a few minutes. © 2008 Springer Science+Business Media, LLC.
CITATION STYLE
Ghosh, A., Heidrich, W., Achutha, S., & O’Toole, M. (2010). A basis illumination approach to BRDF measurement. International Journal of Computer Vision, 90(2), 183–197. https://doi.org/10.1007/s11263-008-0151-7
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