CITATION STYLE
Depeursinge, C., Bergoënd, I., Pavillon, N., Kühn, J., Colomb, T., Montfort, F., … Emery, Y. (2009). Measuring shape and surfaces down to the nanometer and nanosecond scales by digital holographic microscopy. In Fringe 2009 - 6th International Workshop on Advanced Optical Metrology (pp. 411–415). Springer Science and Business Media Deutschland GmbH. https://doi.org/10.1007/978-3-642-03051-2_67
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