Paper presents problems and results of research of the method of mounting the test objects in the test stand. This test stand has been developed to measure thermal characteristics of ultra-precise resistors such as UPR 0.5 D10 distinguished by very low temperature coefficient of resistance (TCR). Main advantage of the utilized test stand is high accuracy (reaching up to 0.05 ppm/° C) of TCR measurement. Obtaining such high measurement accuracy would be not possible without appropriate method of mounting resistors in the test stand. Paper presents two possible methods of mounting resistors and compares their pros and cons, both in function of measurement accuracy as well as ease of use.
CITATION STYLE
Juś, A., Nowak, P., Szewczyk, R., & Radzikowska-Juś, W. (2017). Investigation of the appropriate method of mounting tested elements in the test stand for temperature characteristics of ultra-precise resistors. In Advances in Intelligent Systems and Computing (Vol. 543, pp. 448–458). Springer Verlag. https://doi.org/10.1007/978-3-319-48923-0_47
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