Spatially Resolved XAFS

Abstract

The functions of solid materials are highly related to their structures, and the visualization of heterogeneous structures of solid materials is one of the interesting targets for XAFS analysis. Conventional XAFS measurement is performed by micron-size X-ray beams, and it can provide average structural information of a target sample in a beam spot. In the case of a powder sample, the information of local coordination is averaged for all powders with heterogeneous morphology, composition, surface structures, etc. in a beam spot of X-rays, and the local coordination of inhomogeneous assemblies cannot be separated by the conventional XAFS measurement. Recently, the focusing techniques of X-ray beams are developing and micron to nanometer size X-ray beams can be prepared at synchrotron facilities. Kirkpatrick-Baez (KB) mirrors are practical optics to focus down X-ray beams, and the utilization of such focusing X-ray beams enables to visualize the heterogeneous properties of solid materials. Micro-XAFS and nano-XAFS have been developed as