The XMaS beamline at ESRF: Instrumental developments and high resolution diffraction studies

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Abstract

The beamline, which is situated on a bending magnet at ESRF, comprises a unique combination of instrumentation for high-resolution and magnetic single-crystal diffraction. White-beam operation is possible, as well as focused and unfocused monochromatic modes. In addition to an eleven-axis Huber diffractometer, which facilitates simple operation in both vertical and horizontal scattering geometries, there is an in-vacuum polarisation analyser and slit system, mirrors for harmonic rejection, sub 4.2 K and 1 Tesla magnetic field sample environment, plus a diamond phase plate for polarisation conditioning. The instrumentation developed specifically for this beamline is described, and its use illustrated by recent scientific results.

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Brown, S. D., Bouchenoire, L., Bowyer, D., Kervin, J., Laundy, D., Longfield, M. J., … Stirling, W. G. (2001). The XMaS beamline at ESRF: Instrumental developments and high resolution diffraction studies. Journal of Synchrotron Radiation, 8(6), 1172–1181. https://doi.org/10.1107/S0909049501015394

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