Structural characterization of self-assembled monolayers by unenhanced Raman spectroscopy

Abstract

This paper presents unenhanced Raman spectra of self-assembled monolayers [2-(22-trichlorosilanyldocosoxy)ethyl acetate], grafted on to silicon dioxide wafers, obtained by using a confocal Raman microscope. The quality of monolayer formation, at the micrometer scale, was monitored by drawing maps of a few square micrometers and homogeneous monolayers were obtained using a detergent cleaning procedure. The results are in good agreement with those obtained previously by atomic force microscopy studies. Copyright © 2003 John Wiley & Sons, Ltd.