Probabilistic modeling of fatigue damage accumulation for reliability prediction

76Citations
Citations of this article
79Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

A methodology for probabilistic modeling of fatigue damage accumulation for single stress level and multistress level loading is proposed in this paper. The methodology uses linear damage accumulation model of Palmgren-Miner, a probabilistic S - N curve, and an approach for a one-to-one transformation of probability density functions to achieve the objective. The damage accumulation is modeled as a nonstationary process as both the expected damage accumulation and its variability change with time. The proposed methodology is then used for reliability prediction under single stress level and multistress level loading, utilizing dynamic statistical model of cumulative fatigue damage. The reliability prediction under both types of loading is demonstrated with examples. Copyright © 2011 Vijay Rathod et al.

Cite

CITATION STYLE

APA

Yadav, O. P., Rathod, V., Rathore, A., & Jain, R. (2011). Probabilistic modeling of fatigue damage accumulation for reliability prediction. International Journal of Quality, Statistics, and Reliability, 2011. https://doi.org/10.1155/2011/718901

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free