SEM Image Analysis for Roughness Assessment of Implant Materials

  • Klonowski W
  • Olejarczyk E
  • Stepien R
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Abstract

We propose a new very simple method to determine roughness of a surface of an implant material from its scanning electron microscopy (SEM) image. For this purpose we have combined a preprocessing method that has been used in histopathology with fractal method used in...

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Klonowski, W., Olejarczyk, E., & Stepien, R. (2008). SEM Image Analysis for Roughness Assessment of Implant Materials (pp. 553–560). https://doi.org/10.1007/3-540-32390-2_65

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