Abstract
High Resolution Transmission Electron Microscopy (HRTEM) of non-crystalline or amorphous materials generally serves to the structural characterization of the material itself [1–4], or more practically to the measurement of optical parameters such as the...
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CITATION STYLE
APA
Epicier, T. (2009). Analysis of HRTEM diffractograms from amorphous materials: a simple and minor (but not explained so far?) question revisited. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 109–110). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_55
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