Characterization of Pipe Bomb Fragments using Optical Microscopy and Scanning Electron Microscopy

MJ Platek; OJ Gregory; T Duarte; J Oxley; J Smith; E Bernier

Journal ArticleOPEN ACCESS

Characterization of Pipe Bomb Fragments using Optical Microscopy and Scanning Electron Microscopy

Platek M
Gregory O
Duarte T
et al.

Microscopy and Microanalysis (2010) 16(S2) 1570-1571

DOI: 10.1017/s1431927610059775

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126Readers

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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CITATION STYLE

APA

Platek, M., Gregory, O., Duarte, T., Oxley, J., Smith, J., & Bernier, E. (2010). Characterization of Pipe Bomb Fragments using Optical Microscopy and Scanning Electron Microscopy. Microscopy and Microanalysis, 16(S2), 1570–1571. https://doi.org/10.1017/s1431927610059775

Characterization of Pipe Bomb Fragments using Optical Microscopy and Scanning Electron Microscopy

Abstract

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