Built-in test of analog non-linear circuits in a SOC environment

Abstract

This work describes a methodology for the built-in test of non-linear analog circuits, developed at the system level, by the use of digital non-linear adaptive filters. Non linear analog circuits are widely used on data transmission applications, such as wireless communication, radio and portable multimedia systems. Several non-linear circuits like mixer, automatic gain control amplifiers, peak-detectors and log-amplifiers were simulated, and some prototypes assembled, in order to allow fault injection in the circuit under test. The proposed built-in test methodology is very precise, has low cost when seen at the system level, and allows complete fault coverage with a very small testing time.