Reduction and analysis of two-dimensional diffraction data including texture analysis

Abstract

This chapter provides a commented list of references which the author considers useful for diffraction data analysis such as references relating to Rietveld analysis. In particular, references relating to the analysis of two-dimensional detector data such as image plates or CCDs are given. Literature dealing with texture analysis and interpretation as well as web links for software and online tutorials are also provided. © 2010 Springer Science+Business Media B.V.