Magnetic, electrical and optical properties of nd0.85 k0.15 mno3 thin film

Abstract

K doped Nd–Mn–O based thin film was deposited on Si substrate by using a target material of composition Nd0.85 K0.15 MnO3 and a RF magneton sputtering unit. The film was found to be in single phase form with average crystallite size of 54 nm. The band gap and the refractive index values were determined by analyzing the transmission data. They exhibit paramagnetic to ferromagnetic transition along with a signature of antiferromagnetic transition. The magnetic properties such as saturation magnetization, ferromagnetic transition temperature and Curie temperature were determined by analyzing the dc magnetization data. The sizes of grain were determined from FE-SEM images. The film exhibits metal insulator transition in the vicinity of ferromagnetic transition temperature.