Development of TEM holder generating in-plane magnetic field used for in-situ TEM observation

Abstract

For easy performance of Lorentz microscopy with simultaneous electric measurements, a special specimen holder for transmission electron microscopy (TEM) has been developed that has electromagnets to generate magnetic field and four leads for electric measurements. This TEM holder was evaluated by checking experimental results of permalloy (Ni0.8Fe0.2) patterns. Clear observations of domain wall injection into a nanowire and movement of magnetic vortices as well as magnetoresitance during the development of magnetic domains were performed. It appeared possible to apply in-plane magnetic fields along any direction with intensities of less than about 15.9 kA/m (200 Oe). © 2014 The Japan Institute of Metals and Materials.