Luminescence properties of Si nanocrystals fabricated by ion beam sputtering and annealing

9Citations
Citations of this article
23Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

During the past several decades, Si nanocrystals (NCs) have received remarkable attention in view of potential optoelectronic device applications. This paper summarizes recent progress in the study of luminescence from Si NCs, such as photoluminescence (PL), cathodoluminescence, time-solved PL, and electroluminescence. The paper is especially focused on Si NCs produced by ion beam sputtering deposition of SiO x single layer or SiO x /SiO 2 multilayers and subsequent annealing. The effects of stoichiometry (x) and thickness of Si O x layers on the luminescence are analyzed in detail and discussed based on possible mechanisms. © 2012 Sung Kim et al.

Cite

CITATION STYLE

APA

Kim, S., Shin, D. H., Shin, D. Y., Kim, C. O., Park, J. H., Yang, S. B., … Kim, J. G. (2012). Luminescence properties of Si nanocrystals fabricated by ion beam sputtering and annealing. Journal of Nanomaterials. https://doi.org/10.1155/2012/572746

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free