We demonstrated epitaxial growth of GaN (0001) films on nearly lattice-matched Hf (0001) substrates by using a low-temperature (LT) epitaxial growth technique. High-temperature growth of GaN films results in the formation of polycrystalline films due to significant reaction at GaN/Hf heterointerfaces, while LT-growth allowed us to suppress the interfacial reactions and to obtain epitaxial GaN films on Hf substrates with a GaN 11 2 0 / / Hf 11 2 0 in-plane orientation. LT-grown GaN films can act as buffer layers for GaN growth at high temperatures. The interfacial layer thickness at the LT-GaN/Hf heterointerface was as small as 1 nm, and the sharpness of the contact remained unchanged even after annealing up to approximately 700 °C, which likely accounts for the dramatic improvement in GaN crystalline quality on Hf substrates.
CITATION STYLE
Kim, H. R., Ohta, J., Inoue, S., Ueno, K., Kobayashi, A., & Fujioka, H. (2016). Epitaxial growth of GaN films on nearly lattice-matched hafnium substrates using a low-temperature growth technique. APL Materials, 4(7). https://doi.org/10.1063/1.4959119
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