Effect of Temperature of Electron Beam Evaporated CdSe Thin Films

Abstract

CdSe thin films were deposited on a glass substrate by using electron beam evaporation technique. The as deposited films were annealed from 100ºC to 300°C with an increment of 100°C. Morphological, structural and optical characterization of the films was carried out by using scanning electron microscope (SEM), X-ray diffraction (XRD), ultraviolet-visible (UV-Vis) spectroscopy; and Fourier transform infrared spectroscopy. The X-ray diffraction pattern that the film has a cubic phase with preferred orientation (100), the grain size was found to be in the range of 29-46 nm. SEM results reveal that film grains are polycrystalline in nature covered the whole surface of the substrate.