Time resolved x-ray absorption spectroscopy is a powerful tool to follow the fast atomic, molecular changes on the atomic time and spatial scale. Here we demonstrate timeresolved XANES and EXAFS relying on a laser driven ultrafast XUV source. We have examined the electronic and structural changes in amorphous Si with a temporal resolution of 20 fs.
CITATION STYLE
Seres, E., & Spielmann, C. (2009). Sub-20-fs Optical Pump-X-ray Probe Spectroscopy beyond the Si K Edge. In Springer Series in Chemical Physics (Vol. 92, pp. 128–130). Springer Science and Business Media Deutschland GmbH. https://doi.org/10.1007/978-3-540-95946-5_42
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