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Time and momentum resolved resonant magnetic x-ray diffraction on EuTe

EPJ Web of Conferences (2013) 41
DOI: 10.1051/epjconf/20134103014
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Abstract

We used fs- and ps- resonant magnetic x-ray diffraction to probe the laser-induced changes to the magnetic profile in thin films of the antiferromagnetic semicon-ductor EuTe. © Owned by the authors, published by EDP Sciences, 2013.

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Trabant, C., Pontius, N., Schierle, E., Weschke, E., Kachel, T., Springholz, G., … Schüßler-Langeheine, C. (2013). Time and momentum resolved resonant magnetic x-ray diffraction on EuTe. In EPJ Web of Conferences (Vol. 41). https://doi.org/10.1051/epjconf/20134103014

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