Abstract
Drift-diffusion modeling is used to quantify different loss mechanisms in polymer:fullerene photovoltaic devices. Based on the modeling, which takes into account the carrier-density dependence of the mobility, the relative importance of geminate recombination, bimolecular recombination, and the space-charge effect are able to be quantified under different conditions. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
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CITATION STYLE
APA
Gao, F., Wang, J., Blakesley, J. C., Hwang, I., Li, Z., & Greenham, N. C. (2012). Quantifying loss mechanisms in polymer:Fullerene photovoltaic devices. Advanced Energy Materials, 2(8), 956–961. https://doi.org/10.1002/aenm.201200073
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