Excitation to defect-bound band edge states in two-dimensional semiconductors and its effect on carrier transport

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Abstract

The ionization of dopants is a crucial process for electronics, yet it can be unexpectedly difficult in two-dimensional materials due to reduced screening and dimensionality. Using first-principles calculations, here we propose a dopant ionization process for two-dimensional semiconductors where charge carriers are only excited to a set of defect-bound band edge states, rather than to the true band edge states, as is the case in three-dimensions. These defect-bound states have small enough ionization energies but large enough spatial delocalization. With a modest defect density, carriers can transport through band by such states.

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Wang, D., Han, D., West, D., Chen, N. K., Xie, S. Y., Tian, W. Q., … Li, X. B. (2019). Excitation to defect-bound band edge states in two-dimensional semiconductors and its effect on carrier transport. Npj Computational Materials, 5(1). https://doi.org/10.1038/s41524-018-0145-0

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