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A simple interference scanner

  • Hinrichsen P
American Journal of Physics (2001) 69(8) 917-919
DOI: 10.1119/1.1351146
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Abstract

An inexpensive device for measuring interference and diffraction patterns, based on a linear potentiometer for position determination, is described. The linearity, resolution, and reproducibility are discussed.

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APA

Hinrichsen, P. F. (2001). A simple interference scanner. American Journal of Physics, 69(8), 917–919. https://doi.org/10.1119/1.1351146

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