Enhancing capabilities of Atomic Force Microscopy by tip motion harmonics analysis

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Abstract

Motion of a tip used in an atomic force microscope can be described by the Lennard-Jones potential, approximated by the van der Waals force in a long-range interaction. Here we present a general framework of approximation of the tip motion by adding three terms of Taylor series what results in non-zero harmonics in an output signal. We have worked out a measurement system which allows recording of an excitation tip signal and its non-linear response. The first studies of spectrum showed that presence of the second and the third harmonics in cantilever vibrations may be observed and used as a new method of the investigated samples characterization.

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Babicz, S., Smulko, J., & Zieliński, A. (2013). Enhancing capabilities of Atomic Force Microscopy by tip motion harmonics analysis. Bulletin of the Polish Academy of Sciences: Technical Sciences, 61(2), 535–539. https://doi.org/10.2478/bpasts-2013-0053

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