LARBED: Exploring the fourth dimension in electron diffraction

Abstract

This chapter describes a novel method for acquiring information-rich convergent beam-like patterns of thin specimen and materials with very large lattice constants. Yet, despite effective convergence angles of up to 100 mrad diffraction orders do not overlap. It is demonstrated how the 4-dimensional information carried by these patterns may be used to solve the dynamic inversion problem in electron diffraction and reconstruct 3D diffraction patterns. It is also shown how aberrations of the illumination system up to seventh order are measured in a fully automated manner and may be compensated on any TEM without installing any additional hardware. © 2012 Springer Science+Business Media Dordrecht.