Analysis of Local Structure, Chemistry and Bonding by Electron Energy Loss Spectroscopy

Abstract

In the present chapter, the reader will first be introduced briefly to the basic principles of analytical transmission electron microscopy (ATEM) with special emphasis on electron energy-loss spectroscopy (EELS) and energy-filtering TEM. The quantification of spectra to obtain chemical information and the origin and interpretation of near-edge fine structures in EELS (ELNES) are discussed. Special attention will be given to the characterization of internal interfaces and the literature in this area will be reviewed. Selected examples of the application of ATEM in the investigation of internal interfaces will be given. These examples include both EELS in the energy-filtering TEM and in the scanning transmission electron microscope (STEM).