CITATION STYLE
Bender, J. (1997). Barkhausen Noise and Eddy Current Microscopy (BEMI): Microscope Configuration, Probes and Imaging Characteristics. In Review of Progress in Quantitative Nondestructive Evaluation (pp. 2121–2128). Springer US. https://doi.org/10.1007/978-1-4615-5947-4_277
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