Enhancement Physical Performance of Nanostructured CuO Films via Surfactant TX-100

Abstract

In this study, we informed a systematic approach to obtain CuO films with and without TX-100 surfactant by the SILAR procedure. Morphological, structural and optical features of the CuO films were researched by metallurgical microscope, scanning electron microscopy, X-ray diffraction analysis and ultraviolet-visible spectrophotometry respectively with respect to concentrations of TX-100 agent. Metallurgical and scanning electron microscope photographs displayed that the morphology of the film surface was impressed by surfactant TX-100. X-ray diffraction patterns verified that all CuO films have monoclinic crystal lattice structure with preferential orientations of (1 11) and (111) planes. Ultraviolet-visible spectra demonstrated that the optical bandgap and transmittance values of the films were altered with TX-100 content.