An accurate structure analysis of a Ba3TaGa3Si2O14 single crystal from langasite family was performed using four X-ray diffraction data sets collected on a diffractometer equipped with a CCD area detector (sp. gr. P321, Z = 1, sinθ/λ ≤ 1.35 Å–1; at 295 K a = 8.516(1) Å, c = 5.1910(6) Å, R/wR = 0.58/0.56%, Δρmin/Δρmax =–0.73/0.42 e/Å3, 4414 independent reflections; at 106 K a = 8.5109(9) Å, c = 5.1861(9) Å, R/wR = 0.75/0.86%, Δρmin/Δρmax =–0.81/1.06 e/Å3, 4382 reflections). The distinguishing feature of the Ba3TaGa3Si2O14 structure is a strong disorder of the Ga atom at the 3f site. Structural transformations in the series of Сa3TaGa3Si2O14–Sr3TaGa3Si2O14–Ba3TaGa3Si2O14–Ba3TaFe3Si2O14 crystals were analyzed.
CITATION STYLE
Dudka, A. P. (2018). Accurate Refinement of the Crystal Structure of Ba3TaGa3Si2O14 from Langasite Family and Analysis of Structural Transformations Due to Isomorphous Cation Substitutions. Crystallography Reports, 63(2), 172–177. https://doi.org/10.1134/S1063774518020049
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