Creation and investigation of electronic defects on methylammonium lead iodide (CH 3 NH 3 PbI 3) films depending on atmospheric conditions

Abstract

Methylammonium lead iodide (MAPbI3) (CH3NH3PbI3) is popular material for edge technology application, but it still includes many uncertainties. Particularly, molecular and electronic degradation (electronic defect distribution) and mobility–lifetime product still hold many mysteries. Stemming from the atmospheric or light-induced degradation, mobility–lifetime product changes are still unknown and haven’t been studied up to now. In this study, mobility–lifetime product change was investigated depending on degradation source such as atmospheric and light soaked. MAPbI3 films were deposited by thermal chemical vapor deposition (thermal CVD). Structural analysis was done by X-ray diffraction (XRD), respectively. Deposited MAPbI3 films were exposed to laboratory ambient, vacuum atmosphere, deionized water vapor (DIWV) atmosphere and UV light soaking at constant temperature (300K) to define changes on mobility–lifetime product.