Further capacitive imaging experiments using modified probes

Abstract

In recent years, capacitive imaging (CI) is growing in popularity within the NDE communities, as it has the potential to test materials and structures for defects that are not easily tested by other techniques. In previous work, The CI technique has been successfully used on a various types of materials, including concrete, glass/carbon fibre composite, steel, etc. In such CI experiments, the probes are normally with symmetric or concentric electrodes etched onto PCBs. In addition to these conventional coplanar PCB probes, modified geometries can be made and they can lead to different applications. A brief overview of these modified probes, including high resolution surface imaging probe, combined CI/eddy current probe, and CI probe using an oscilloscope probe as the sensing electrode, is presented in this work. The potential applications brought by these probes are also discussed.