Abstract
The chemical instability of line patterned Ge2 Sb2 Te5 was studied by transmission electron microscopy after electrically inducing melt and solidification. Compositional analysis showed elemental separation of Te to the anode side, while Ge and Sb mutually separated at the cathode side. Such elemental separation of Ge2 Sb2 Te5 is explained by the electric field effects and thermodynamic driving forces. © 2009 American Institute of Physics.
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CITATION STYLE
Kang, D., Lee, D., Kim, H. M., Nam, S. W., Kwon, M. H., & Kim, K. B. (2009). Analysis of the electric field induced elemental separation of Ge 2 Sb2 Te5 by transmission electron microscopy. Applied Physics Letters, 95(1). https://doi.org/10.1063/1.3168517
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