Principles and applications of Ig-RTN in Nano-scaled MOSFET

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Chung, S. S., & Hsieh, E. R. (2020). Principles and applications of Ig-RTN in Nano-scaled MOSFET. In Noise in Nanoscale Semiconductor Devices (pp. 175–200). Springer International Publishing. https://doi.org/10.1007/978-3-030-37500-3_5

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