CITATION STYLE
Griscom, D. L., Brown, D. B., & Saks, N. S. (1988). Nature of Radiation-Induced Point Defects in Amorphous SiO2 and their Role in SiO2-ON-Si Structures. In The Physics and Chemistry of SiO2 and the Si-SiO2 Interface (pp. 287–297). Springer US. https://doi.org/10.1007/978-1-4899-0774-5_31
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