In the foregoing chapters, the reliability of organic compounds in microelectronics and optoelectronics was discussed. It provided a state of the art in reliability concepts for materials used in electronic products. It also enlightened the direction in reliability concepts for these products. In this chapter, we discuss the outlook where we envision that physics of failure will be replaced by physics of degradation. New technologies, like health monitoring and digital twins, are needed to make this foreseen shift in reliability concepts.
CITATION STYLE
van Driel, W. D., Mehr, M. Y., Fan, X., & Zhang, G. Q. (2022). Outlook: From Physics of Failure to Physics of Degradation. In Reliability of Organic Compounds in Microelectronics and Optoelectronics: From Physics-of-Failure to Physics-of-Degradation (pp. 535–538). Springer International Publishing. https://doi.org/10.1007/978-3-030-81576-9_17
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