Abstract
Crystals are like people: it is the defects in them which tend to make them interesting! This chapter describes the use of STEM imaging for the structural characterization of crystalline materials, perfect and imperfect. The object of the chapter is to describe basic principles as clearly as possible, using a minimum of mathematics.
Cite
CITATION STYLE
APA
Humphreys, C. J. (1979). Stem Imaging of Crystals and Defects. In Introduction to Analytical Electron Microscopy (pp. 305–332). Springer US. https://doi.org/10.1007/978-1-4757-5581-7_11
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