Studies on the relaxor behavior of sol-gel derived Ba(ZrxTi 1-x)O3 (0.30≤x≤0.70) thin films

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Abstract

We have studied the relaxor behavior of sol-gel derived Ba(Zr xTi1-x)O3 (0.30≤x≤0.70) thin films. The plausible mechanism of the relaxor behavior has been analyzed from the dielectric data and micro-Raman spectra. Substitution of Zr+4 for Ti+4 in BaTiO3 lattice reduces its long-range polarization order yielding a diffused paraelectric to ferroelectric phase transition. The solid solution system is visualized as a mixture of Ti+4 rich polar region and Zr+4 rich regions and with the increase in Zr contents the volume fraction of the polar regions are progressively reduced. At about 25.0 at% Zr contents the polar regions exhibit typical relaxor behavior. The degree of relaxation increases with Zr content and maximizes at 40.0 at% Zr doped film. The frequency dependence of the polar regions follows Vogel-Fulcher relation with a characteristic cooperative freezing at freezing temperature (T f). Below Tf, a long range polarization ordering was ascertained from the polarization hysteresis measurement © 2007 Springer Science+Business Media LLC.

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Dixit, A., Majumder, S. B., Katiyar, R. S., & Bhalla, A. S. (2007). Studies on the relaxor behavior of sol-gel derived Ba(ZrxTi 1-x)O3 (0.30≤x≤0.70) thin films. In Frontiers of Ferroelectricity: A Special Issue of the Journal of Materials Science (pp. 87–96). Springer US. https://doi.org/10.1007/978-0-387-38039-1_8

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