Phase and microstructural analysis of NdTi0.8M0.2O3.4 (M = Al, Ga) microwave ceramics

Abstract

In this paper, we report the characterization of NdTi0.8M0.2O3.4 (M = Ga, Al) ceramics prepared via mixed oxide solid state sintering route. X-ray diffraction analysis of the samples revealed the formation of single phase for NdTi0.8Ga0.2O3.4 sample while secondary phase was formed in the case of NdTi0.8Al0.2O3.4. Microstructural analysis of the sample showed dense packed grains. NdTi0.8M0.2O3.4 with M = Ga and Al exhibited a dielectric constant (ɛr) = 34, quality factor (Q×f) = 9,776 and 10,867 GHz and temperature coefficient of resonance frequency (τf) =-113 and-90 ppm/oC, respectively. Further work is required on tuning the low τf of the samples for possible applications in the GHz frequency range.